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Testing: split input test (#2762)
test(pointing): Add mock input device. New mock input device to generate input events for tests. test(split): Add peripheral input test. Test event propagation from peripheral input devices. fix(split): Proper scoping for local within switch. Minor compile fix. chore: Fix up test snapshots after logging changes. Adjust the test snapshots after logging changes to the central. fix(kscan): Don't fire last mock event twice. Fix a bug where the kscan mock would raise the last mock event twice before halting processing.
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@@ -582,7 +582,7 @@ static uint8_t split_central_chrc_discovery_func(struct bt_conn *conn,
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LOG_DBG("[ATTRIBUTE] handle %u", attr->handle);
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switch (params->type) {
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case BT_GATT_DISCOVER_CHARACTERISTIC:
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case BT_GATT_DISCOVER_CHARACTERISTIC: {
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const struct bt_uuid *chrc_uuid = ((struct bt_gatt_chrc *)attr->user_data)->uuid;
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if (bt_uuid_cmp(chrc_uuid, BT_UUID_DECLARE_128(ZMK_SPLIT_BT_CHAR_POSITION_STATE_UUID)) ==
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@@ -665,6 +665,7 @@ static uint8_t split_central_chrc_discovery_func(struct bt_conn *conn,
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#endif /* IS_ENABLED(CONFIG_ZMK_SPLIT_BLE_CENTRAL_BATTERY_LEVEL_FETCHING) */
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}
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break;
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}
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case BT_GATT_DISCOVER_STD_CHAR_DESC:
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#if IS_ENABLED(CONFIG_ZMK_INPUT_SPLIT)
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if (bt_uuid_cmp(slot->discover_params.uuid, BT_UUID_GATT_CCC) == 0) {
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