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Testing: split input test (#2762)
test(pointing): Add mock input device. New mock input device to generate input events for tests. test(split): Add peripheral input test. Test event propagation from peripheral input devices. fix(split): Proper scoping for local within switch. Minor compile fix. chore: Fix up test snapshots after logging changes. Adjust the test snapshots after logging changes to the central. fix(kscan): Don't fire last mock event twice. Fix a bug where the kscan mock would raise the last mock event twice before halting processing.
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@@ -13,6 +13,9 @@ profile 0 <dbg> ble_central: discover_func: [ATTRIBUTE] handle 23
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profile 0 <dbg> ble_central: discover_func: [ATTRIBUTE] handle 28
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profile 0 <dbg> ble_central: discover_func: [ATTRIBUTE] handle 30
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profile 0 <dbg> ble_central: discover_func: [SUBSCRIBED]
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profile 0 <dbg> ble_central: discover_func: [ATTRIBUTE] handle 32
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profile 0 <dbg> ble_central: discover_func: [ATTRIBUTE] handle 34
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profile 0 <dbg> ble_central: discover_func: [CONSUMER SUBSCRIBED]
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profile 0 <dbg> ble_central: notify_func: payload
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profile 0 00 00 04 00 00 00 00 00 |........
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profile 0 <dbg> ble_central: notify_func: payload
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