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8dddb1d9d7
test(pointing): Add mock input device. New mock input device to generate input events for tests. test(split): Add peripheral input test. Test event propagation from peripheral input devices. fix(split): Proper scoping for local within switch. Minor compile fix. chore: Fix up test snapshots after logging changes. Adjust the test snapshots after logging changes to the central. fix(kscan): Don't fire last mock event twice. Fix a bug where the kscan mock would raise the last mock event twice before halting processing.
9 lines
196 B
Plaintext
9 lines
196 B
Plaintext
# Copyright (c) 2020 The ZMK Contributors
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# SPDX-License-Identifier: MIT
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rsource "gpio/Kconfig"
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rsource "kscan/Kconfig"
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rsource "sensor/Kconfig"
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rsource "display/Kconfig"
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rsource "input/Kconfig"
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