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8dddb1d9d7
test(pointing): Add mock input device. New mock input device to generate input events for tests. test(split): Add peripheral input test. Test event propagation from peripheral input devices. fix(split): Proper scoping for local within switch. Minor compile fix. chore: Fix up test snapshots after logging changes. Adjust the test snapshots after logging changes to the central. fix(kscan): Don't fire last mock event twice. Fix a bug where the kscan mock would raise the last mock event twice before halting processing.
9 lines
120 B
Plaintext
9 lines
120 B
Plaintext
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if INPUT
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config ZMK_INPUT_MOCK
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bool "Input Mock"
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default y
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depends on DT_HAS_ZMK_INPUT_MOCK_ENABLED
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endif |