Files
zmk/app/module/dts/bindings/input/zmk,input-mock.yaml
Pete Johanson 8dddb1d9d7 Testing: split input test (#2762)
test(pointing): Add mock input device.

New mock input device to generate input events for tests.

test(split): Add peripheral input test.

Test event propagation from peripheral input devices.

fix(split): Proper scoping for local within switch.

Minor compile fix.

chore: Fix up test snapshots after logging changes.

Adjust the test snapshots after logging changes to the central.

fix(kscan): Don't fire last mock event twice.

Fix a bug where the kscan mock would raise the last mock event
twice before halting processing.
2025-01-13 15:15:16 -05:00

22 lines
545 B
YAML

# Copyright (c) 2024 The ZMK Contributors
# SPDX-License-Identifier: MIT
description: |
Allows defining a mock input driver that simulates periodic input events.
compatible: "zmk,input-mock"
properties:
event-startup-delay:
type: int
default: 0
description: Milliseconds to delay before starting generating the events
event-period:
type: int
description: Milliseconds between each generated event
events:
type: array
description: List of tuples of (type, code, value, sync)
exit-after:
type: boolean