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test(pointing): Add mock input device. New mock input device to generate input events for tests. test(split): Add peripheral input test. Test event propagation from peripheral input devices. fix(split): Proper scoping for local within switch. Minor compile fix. chore: Fix up test snapshots after logging changes. Adjust the test snapshots after logging changes to the central. fix(kscan): Don't fire last mock event twice. Fix a bug where the kscan mock would raise the last mock event twice before halting processing.
22 lines
545 B
YAML
22 lines
545 B
YAML
# Copyright (c) 2024 The ZMK Contributors
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# SPDX-License-Identifier: MIT
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description: |
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Allows defining a mock input driver that simulates periodic input events.
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compatible: "zmk,input-mock"
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properties:
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event-startup-delay:
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type: int
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default: 0
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description: Milliseconds to delay before starting generating the events
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event-period:
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type: int
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description: Milliseconds between each generated event
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events:
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type: array
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description: List of tuples of (type, code, value, sync)
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exit-after:
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type: boolean
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