Files
zmk/app/tests/ble/split/peripheral-input/peripheral.overlay
Pete Johanson 8dddb1d9d7 Testing: split input test (#2762)
test(pointing): Add mock input device.

New mock input device to generate input events for tests.

test(split): Add peripheral input test.

Test event propagation from peripheral input devices.

fix(split): Proper scoping for local within switch.

Minor compile fix.

chore: Fix up test snapshots after logging changes.

Adjust the test snapshots after logging changes to the central.

fix(kscan): Don't fire last mock event twice.

Fix a bug where the kscan mock would raise the last mock event
twice before halting processing.
2025-01-13 15:15:16 -05:00

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#include <dt-bindings/zmk/kscan_mock.h>
#include <zephyr/dt-bindings/input/input-event-codes.h>
#include "shared.dtsi"
&kscan {
events = <>;
/delete-property/ exit-after;
};
/ {
mock_input: mock_input {
compatible = "zmk,input-mock";
status = "okay";
event-startup-delay = <4000>;
event-period = <2000>;
events
= <INPUT_EV_REL INPUT_REL_X 100 0>
, <INPUT_EV_REL INPUT_REL_Y 100 1>
, <INPUT_EV_REL INPUT_REL_X 40 0>
, <INPUT_EV_REL INPUT_REL_Y 50 1>
;
exit-after;
};
};
&split_input {
device = <&mock_input>;
};